Using fourier-plane imaging microscopy for determining transition-dipole-moment orientations in organic light-emitting devices

Jongchan Kim, Haonan Zhao, Shaocong Hou, Mandeep Khatoniar, Vinod Menon, Stephen R. Forrest

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

We use Fourier-plane imaging microscopy (FIM) to determine the transition-dipole-moment orientation in doped organic emissive thin films. The use of FIM enables precise, sensitive, and rapid measurement of dipole orientation in the emission layer of an organic light-emitting device (OLED). An optical model of a stratified birefringent multilayer is introduced for interpreting results obtained by FIM. Using the model, we determine the average orientation of transition-dipole-moment vectors of three phosphorescent dopant emitters. The dipole alignment measured by FIM quantitatively explains the difference in OLED efficiencies using these archetype dopant molecules. FIM provides a nondestructive tool to measure and ultimately improve the outcoupling efficiency of OLEDs and other light-emitting devices.

Original languageEnglish
Article number034048
JournalPhysical Review Applied
Volume14
Issue number3
DOIs
Publication statusPublished - 2020 Sept

Bibliographical note

Publisher Copyright:
© 2020 American Physical Society.

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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