TY - GEN
T1 - Using fiber-optic probes for photoluminescence and evaluation of an InGaN/GaN epi-wafer
AU - Jung, Woohyun
AU - Kim, Jongki
AU - Joe, Hang Eun
AU - Min, Byung Kwon
AU - Oh, Kyunghwan
PY - 2013
Y1 - 2013
N2 - Photoluminescence is one of the methods used for analyzing the optical characteristics of materials. For components in solid-state lighting such as GaN-based LEDs, the use of an LED structure configuration on a patterned sapphire substrate has shown to be highly effective in improving light-extraction efficiency. We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a 20 × 20 μm2 area with a high spatial resolution. We applied the system in morphological study of InGaN/GaN epitaxial layers for LED applications. With this system, we obtained peak intensity, peak wavelength, and full width at half maximum of the emission spectrum.
AB - Photoluminescence is one of the methods used for analyzing the optical characteristics of materials. For components in solid-state lighting such as GaN-based LEDs, the use of an LED structure configuration on a patterned sapphire substrate has shown to be highly effective in improving light-extraction efficiency. We proposed a compact and simple photoluminescence measurement system based on fiber-optic probes that can be scanned over a 20 × 20 μm2 area with a high spatial resolution. We applied the system in morphological study of InGaN/GaN epitaxial layers for LED applications. With this system, we obtained peak intensity, peak wavelength, and full width at half maximum of the emission spectrum.
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U2 - 10.1117/12.2024634
DO - 10.1117/12.2024634
M3 - Conference contribution
AN - SCOPUS:84888167269
SN - 9780819496898
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Dimensional Optical Metrology and Inspection for Practical Applications II
T2 - 2013 Conference on Dimensional Optical Metrology and Inspection for Practical Applications
Y2 - 25 August 2013 through 26 August 2013
ER -