Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits

Computer Science

• Integrated Circuit 100%
• Experimental Result 50%
• Pattern Classification 50%
• Classification (Machine Learning) 50%
• Conventional Method 50%
• Simulation Mode 50%
• Classification Models 50%
• Test Condition 50%
• High Dimensional Data 50%
• Extraction Process 50%
• Automatic Classification 50%
• Feature Extraction 50%
• Records 50%