Understanding structure-property relationship of resistive switching oxide thin films using a conical filament model

Kyung Min Kim, Min Hwan Lee, Gun Hwan Kim, Seul Ji Song, Jun Yeong Seok, Jung Ho Yoon, Cheol Seong Hwang

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)

Abstract

The relations between the reset current IR, room temperature filament resistance R0, and third harmonic coefficient B0 were evaluated by a conical filament model. It was found that IR ∼1/ R0 when the filament is either very weak, where the filament is more conical, or quite strong, where the filament is more cylindrical. The physical implication of the B0 was also understood from the materials properties. The coherence between the model expectations for the bulkier conical filaments, typically found in TiO2, and the more random-network like filaments, typically found in NiO, suggests a common switching mechanism works in both materials.

Original languageEnglish
Article number162912
JournalApplied Physics Letters
Volume97
Issue number16
DOIs
Publication statusPublished - 2010 Oct 18

Bibliographical note

Funding Information:
This study was supported by the National Research Program for the Nano Semiconductor Apparatus Development sponsored by the Korea Ministry of Knowledge and Economy, the Convergent Research Center program (Grant No. 2010K000977), and World Class University program through the National Research Foundation of Korea funded by the Ministry of Education, Science, and Technology (Grant No. R31-2008-000-10075-0).

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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