Unconstrained face verification with a dual-layer block-based metric learning

Siew Chin Chong, Andrew Beng Jin Teoh, Thian Song Ong

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


In this paper, a dual-layer block-based metric learning technique is proposed to better discriminate the face image pairs and accelerate the overall verification process under the unconstrained environment. The input images are processed as blocks to provide a richer base of face features. Our proposed method is formed by two layers, in which the first layer assists in extracting the compact block-based descriptors without the existence of full class label information and to refine the within-class and between-class scatter matrices while the second layer integrates the face descriptors of all blocks. The proposed scheme has computational advantage over the single metric learning method while it exploits the correlations among the multiple metrics from different descriptors. The performance of our proposed method is evaluated on the Labeled Faces in the Wild database and achieves an improved performance when compared with the state-of-the-art methods in terms of verification rate and computation time.

Original languageEnglish
Pages (from-to)1703-1719
Number of pages17
JournalMultimedia Tools and Applications
Issue number2
Publication statusPublished - 2017 Jan 1

Bibliographical note

Publisher Copyright:
© 2015, Springer Science+Business Media New York.

All Science Journal Classification (ASJC) codes

  • Software
  • Media Technology
  • Hardware and Architecture
  • Computer Networks and Communications


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