Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2

Hyemin Bae; Sangwan Sim; Taeyoung Kim; Doeon Lee; Dong Hwi Kim; Gwangmook Kim; Wooyoung Shim; Moon Ho Jo; Hyunyong Choi

Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂

Hyemin Bae, Sangwan Sim, Taeyoung Kim, Doeon Lee, Dong Hwi Kim, Gwangmook Kim, Wooyoung Shim, Moon Ho Jo, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report the two-pulse time-resolved photocurrent measurements in a group VII ReS₂. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
Publication status	Published - 2018 Aug 6
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 2018 May 13 → 2018 May 18

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	18/5/13 → 18/5/18

Bibliographical note

Publisher Copyright:
© 2018 OSA.

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Bae, H., Sim, S., Kim, T., Lee, D., Kim, D. H., Kim, G., Shim, W., Jo, M. H., & Choi, H. (2018). Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂ In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings Article 8427390 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..

Bae, Hyemin ; Sim, Sangwan ; Kim, Taeyoung et al. / Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂ 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

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title = "Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2 ",

abstract = "We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.",

author = "Hyemin Bae and Sangwan Sim and Taeyoung Kim and Doeon Lee and Kim, {Dong Hwi} and Gwangmook Kim and Wooyoung Shim and Jo, {Moon Ho} and Hyunyong Choi",

note = "Publisher Copyright: {\textcopyright} 2018 OSA.; 2018 Conference on Lasers and Electro-Optics, CLEO 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

month = aug,

day = "6",

language = "English",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

address = "United States",

}

Bae, H, Sim, S, Kim, T, Lee, D, Kim, DH, Kim, G, Shim, W, Jo, MH & Choi, H 2018, Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂ in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8427390, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 18/5/13.

Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂ . / Bae, Hyemin; Sim, Sangwan; Kim, Taeyoung et al.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8427390 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS2

AU - Bae, Hyemin

AU - Sim, Sangwan

AU - Kim, Taeyoung

AU - Lee, Doeon

AU - Kim, Dong Hwi

AU - Kim, Gwangmook

AU - Shim, Wooyoung

AU - Jo, Moon Ho

AU - Choi, Hyunyong

PY - 2018/8/6

Y1 - 2018/8/6

N2 - We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

AB - We report the two-pulse time-resolved photocurrent measurements in a group VII ReS2. The absence of bias dependence on the photocurrent recovery implies that the escape time of photoexcited carrier is much faster than electron-hole recombination.

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M3 - Conference contribution

AN - SCOPUS:85052579785

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018

Y2 - 13 May 2018 through 18 May 2018

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Bae H, Sim S, Kim T, Lee D, Kim DH, Kim G et al. Ultrafast time-resolved photocurrent measurement of carrier escape dynamics in anisotropic ReS₂ In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8427390. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).