Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi2Se3

Jekwan Lee; Sangwan Sim; Sungjun Park; Soohyun Park; Seungwan Cho; Sooun Lee; Hoil Kim; Jehyun Kim; Wooyoung Shim; Junsung Kim; Dohun Kim; Hyunyong Choi

Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃

Jekwan Lee, Sangwan Sim, Sungjun Park, Soohyun Park, Seungwan Cho, Sooun Lee, Hoil Kim, Jehyun Kim, Wooyoung Shim, Junsung Kim, Dohun Kim, Hyunyong Choi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We have measured the temporally-resolved helicity-dependent photocurrent at the Bi₂Se₃ topological insulator and identified that the skew scattering induces spin Hall effect while the spin suffers Elliott-Yafet relaxation at the bulk state of the Bi₂Se₃.

Original language	English
Title of host publication	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781943580422
Publication status	Published - 2018 Aug 6
Event	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - San Jose, United States Duration: 2018 May 13 → 2018 May 18

Publication series

Name	2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

Other

Other	2018 Conference on Lasers and Electro-Optics, CLEO 2018
Country/Territory	United States
City	San Jose
Period	18/5/13 → 18/5/18

Bibliographical note

Publisher Copyright:
© 2018 OSA.

All Science Journal Classification (ASJC) codes

Instrumentation
Atomic and Molecular Physics, and Optics

Cite this

Lee, J., Sim, S., Park, S., Park, S., Cho, S., Lee, S., Kim, H., Kim, J., Shim, W., Kim, J., Kim, D., & Choi, H. (2018). Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃ In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings [8426514] (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings). Institute of Electrical and Electronics Engineers Inc..

Lee, Jekwan ; Sim, Sangwan ; Park, Sungjun et al. / Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃ 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

@inproceedings{8099e49a19bd47c7a8a8635b792d158f,

title = "Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi2Se3 ",

abstract = "We have measured the temporally-resolved helicity-dependent photocurrent at the Bi2Se3 topological insulator and identified that the skew scattering induces spin Hall effect while the spin suffers Elliott-Yafet relaxation at the bulk state of the Bi2Se3.",

author = "Jekwan Lee and Sangwan Sim and Sungjun Park and Soohyun Park and Seungwan Cho and Sooun Lee and Hoil Kim and Jehyun Kim and Wooyoung Shim and Junsung Kim and Dohun Kim and Hyunyong Choi",

note = "Publisher Copyright: {\textcopyright} 2018 OSA.; 2018 Conference on Lasers and Electro-Optics, CLEO 2018 ; Conference date: 13-05-2018 Through 18-05-2018",

year = "2018",

month = aug,

day = "6",

language = "English",

isbn = "9781943580422",

series = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings",

address = "United States",

}

Lee, J, Sim, S, Park, S, Park, S, Cho, S, Lee, S, Kim, H, Kim, J, Shim, W, Kim, J, Kim, D & Choi, H 2018, Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃ in 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings., 8426514, 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2018 Conference on Lasers and Electro-Optics, CLEO 2018, San Jose, United States, 18/5/13.

Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃ . / Lee, Jekwan; Sim, Sangwan; Park, Sungjun et al.
2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2018. 8426514 (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi2Se3

AU - Lee, Jekwan

AU - Sim, Sangwan

AU - Park, Sungjun

AU - Park, Soohyun

AU - Cho, Seungwan

AU - Lee, Sooun

AU - Kim, Hoil

AU - Kim, Jehyun

AU - Shim, Wooyoung

AU - Kim, Junsung

AU - Kim, Dohun

AU - Choi, Hyunyong

PY - 2018/8/6

Y1 - 2018/8/6

N2 - We have measured the temporally-resolved helicity-dependent photocurrent at the Bi2Se3 topological insulator and identified that the skew scattering induces spin Hall effect while the spin suffers Elliott-Yafet relaxation at the bulk state of the Bi2Se3.

AB - We have measured the temporally-resolved helicity-dependent photocurrent at the Bi2Se3 topological insulator and identified that the skew scattering induces spin Hall effect while the spin suffers Elliott-Yafet relaxation at the bulk state of the Bi2Se3.

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M3 - Conference contribution

AN - SCOPUS:85052581063

SN - 9781943580422

T3 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

BT - 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2018 Conference on Lasers and Electro-Optics, CLEO 2018

Y2 - 13 May 2018 through 18 May 2018

ER -

Lee J, Sim S, Park S, Park S, Cho S, Lee S et al. Ultrafast Photocurrent Measurements of Bulk-Conduction Induced Spin Hall Effect in the Topological Insulator Bi₂Se₃ In 2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2018. 8426514. (2018 Conference on Lasers and Electro-Optics, CLEO 2018 - Proceedings).