Abstract
We studied the fabrication of poly-Si TFT (thin film transistor) by using excimer laser crystallization of sputtered a-Si film at below 200°C. We could obtain the precursor a-Si film with low impurity gas content of 0.39 % by using Xe sputtering and poly-Si film with maximum grain size of 1 μm. We successfully fabricated poly-Si TFT with a field-effect mobility of 70 cm 2/V·Sec on glass and 15 cm 2/V·sec on plastic by using ultra low temperature process at below 200°C, respectively.
Original language | English |
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Pages (from-to) | S61-S63 |
Journal | Journal of the Korean Physical Society |
Volume | 48 |
Issue number | SUPPL. 1 |
Publication status | Published - 2006 Jan |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)