Abstract
In this study, we performed excimer laser activation on Phosphorus or Boron-doped a-Si (amorphous silicon) film. We've got a very low sheet resistance (Rs), Rs was 60 ohm/sq. with phosphorus doping and was 65 ohm/sq. with boron doping at each optimized laser irradiation condition. We've found Rs on activated thin film showed an unprecedented behavior in both cases, because Rs had a strong dependency on the crystallinity of the activated Si film.
Original language | English |
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Pages (from-to) | 1112-1115 |
Number of pages | 4 |
Journal | Proceedings of International Meeting on Information Display |
Volume | 2 |
Publication status | Published - 2006 |
Event | 5th International Meeting on Information Display - Seoul, Korea, Republic of Duration: 2005 Jul 19 → 2005 Jul 23 |
All Science Journal Classification (ASJC) codes
- Engineering(all)