Abstract
In this paper, a new high resolution reflectometry scheme, time-frequency domain reflectometry, is proposed to detect and locate a fault in wiring. Traditional reflectometry methods have been achieved in either the time domain or frequency domain only. However, time-frequency domain reflectometry utilizes time and frequency information of a transient signal to detect and locate the fault. The time-frequency domain reflectometry approach described in this paper is characterized by time-frequency reference signal design and post-processing of the reference and reflected signals to detect and locate the fault. Using a computational electromagnetic model of a coaxial cable with a fault, time-frequency domain reflectometry has been demonstrated. Knowledge of time and frequency localized information for the reference and reflected signal gained via time-frequency analysis, allows one to detect the fault and estimate the location accurately.
| Original language | English |
|---|---|
| Pages (from-to) | 86-95 |
| Number of pages | 10 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4791 |
| DOIs | |
| Publication status | Published - 2002 |
| Event | Advanced Signal Processing Algorithms, Architectures, and Implementations XII - Seattle, WA, United States Duration: 2002 Jul 9 → 2002 Jul 11 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering