Thin-film-based field penetration engineering for surface plasmon resonance biosensing

Soon Joon Yoon, Donghyun Kim

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)


Penetration depth defines the measurable range in evanescent-wave-based sensing techniques such as surface plasmon resonance (SPR). We investigate penetration depth variation implemented with dielectric layers in a SPR sensing structure. The results show that the penetration depth can be controlled to increase or decrease depending on a specific configuration. Effective medium theory was introduced to describe the field penetration in dielectric multilayer designs. Comparison was made with the field penetration of a localized SPR structure based on periodic nanowires. The penetration depth variation in response to environmental changes was also explored.

Original languageEnglish
Pages (from-to)2543-2549
Number of pages7
JournalJournal of the Optical Society of America A: Optics and Image Science, and Vision
Issue number9
Publication statusPublished - 2007 Sept

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Computer Vision and Pattern Recognition


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