Thickness-dependent tunable characteristics of (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 thin films prepared by pulsed laser deposition

Koppole C. Sekhar; Sung Hun Key; Kyung Pyo Hong; Chan Su Han; Jong Min Yook; Dong Soo Kim; Jun Chul Kim; Jong Chul Park; Yong Soo Cho

doi:10.1016/j.cap.2011.09.017

Thickness-dependent tunable characteristics of (Ba _0.5Sr _0.5) _0.925K _0.075TiO ₃ thin films prepared by pulsed laser deposition

Koppole C. Sekhar, Sung Hun Key, Kyung Pyo Hong, Chan Su Han, Jong Min Yook, Dong Soo Kim, Jun Chul Kim, Jong Chul Park, Yong Soo Cho

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

The thickness-dependent dielectric properties and tunability of pulsed laser deposited (Ba _0.5Sr _0.5) _0.925K _0.075TiO ₃ (BSKT) thin films with different thickness ranging from 80 to 300 nm has been investigated. Dielectric properties of the BSKT thin films are substantially improved as the BSKT film thickness increases, which can be explained by the model of a low-permittivity dead layer that is connected in series with the bulk region of the film. The estimated values of thickness and the average dielectric constant for the dead layer are 2.4 nm and 23.5, respectively, in a Pt/BSKT/Pt capacitor structure. The tunability and figure of merit increased with increasing film thickness, which are attributed to the change in lattice parameter and the dead layer effect.

Original language	English
Pages (from-to)	654-658
Number of pages	5
Journal	Current Applied Physics
Volume	12
Issue number	3
DOIs	https://doi.org/10.1016/j.cap.2011.09.017
Publication status	Published - 2012 May

Bibliographical note

Funding Information:
This research work was financially supported by the Korea Institute for Advancement of Technology (KIAT) of the Ministry of Knowledge Economy (MKE).

All Science Journal Classification (ASJC) codes

Materials Science(all)
Physics and Astronomy(all)

Access to Document

10.1016/j.cap.2011.09.017

Cite this

@article{326e11932ca144aeaf6b05799b467b24,

title = "Thickness-dependent tunable characteristics of (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 thin films prepared by pulsed laser deposition",

abstract = "The thickness-dependent dielectric properties and tunability of pulsed laser deposited (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 (BSKT) thin films with different thickness ranging from 80 to 300 nm has been investigated. Dielectric properties of the BSKT thin films are substantially improved as the BSKT film thickness increases, which can be explained by the model of a low-permittivity dead layer that is connected in series with the bulk region of the film. The estimated values of thickness and the average dielectric constant for the dead layer are 2.4 nm and 23.5, respectively, in a Pt/BSKT/Pt capacitor structure. The tunability and figure of merit increased with increasing film thickness, which are attributed to the change in lattice parameter and the dead layer effect.",

author = "Sekhar, {Koppole C.} and Key, {Sung Hun} and Hong, {Kyung Pyo} and Han, {Chan Su} and Yook, {Jong Min} and Kim, {Dong Soo} and Kim, {Jun Chul} and Park, {Jong Chul} and Cho, {Yong Soo}",

note = "Funding Information: This research work was financially supported by the Korea Institute for Advancement of Technology (KIAT) of the Ministry of Knowledge Economy (MKE).",

year = "2012",

month = may,

doi = "10.1016/j.cap.2011.09.017",

language = "English",

volume = "12",

pages = "654--658",

journal = "Current Applied Physics",

issn = "1567-1739",

publisher = "Elsevier",

number = "3",

}

TY - JOUR

T1 - Thickness-dependent tunable characteristics of (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 thin films prepared by pulsed laser deposition

AU - Sekhar, Koppole C.

AU - Key, Sung Hun

AU - Hong, Kyung Pyo

AU - Han, Chan Su

AU - Yook, Jong Min

AU - Kim, Dong Soo

AU - Kim, Jun Chul

AU - Park, Jong Chul

AU - Cho, Yong Soo

N1 - Funding Information: This research work was financially supported by the Korea Institute for Advancement of Technology (KIAT) of the Ministry of Knowledge Economy (MKE).

PY - 2012/5

Y1 - 2012/5

N2 - The thickness-dependent dielectric properties and tunability of pulsed laser deposited (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 (BSKT) thin films with different thickness ranging from 80 to 300 nm has been investigated. Dielectric properties of the BSKT thin films are substantially improved as the BSKT film thickness increases, which can be explained by the model of a low-permittivity dead layer that is connected in series with the bulk region of the film. The estimated values of thickness and the average dielectric constant for the dead layer are 2.4 nm and 23.5, respectively, in a Pt/BSKT/Pt capacitor structure. The tunability and figure of merit increased with increasing film thickness, which are attributed to the change in lattice parameter and the dead layer effect.

AB - The thickness-dependent dielectric properties and tunability of pulsed laser deposited (Ba 0.5Sr 0.5) 0.925K 0.075TiO 3 (BSKT) thin films with different thickness ranging from 80 to 300 nm has been investigated. Dielectric properties of the BSKT thin films are substantially improved as the BSKT film thickness increases, which can be explained by the model of a low-permittivity dead layer that is connected in series with the bulk region of the film. The estimated values of thickness and the average dielectric constant for the dead layer are 2.4 nm and 23.5, respectively, in a Pt/BSKT/Pt capacitor structure. The tunability and figure of merit increased with increasing film thickness, which are attributed to the change in lattice parameter and the dead layer effect.

UR - http://www.scopus.com/inward/record.url?scp=84857459283&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84857459283&partnerID=8YFLogxK

U2 - 10.1016/j.cap.2011.09.017

DO - 10.1016/j.cap.2011.09.017

M3 - Article

AN - SCOPUS:84857459283

SN - 1567-1739

VL - 12

SP - 654

EP - 658

JO - Current Applied Physics

JF - Current Applied Physics

IS - 3

ER -