Thermal aging estimation with load cycle and thermal transients for XLPE-insulated underground cable

Y. J. Han, H. M. Lee, Y. J. Shin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Citations (Scopus)

Abstract

Loading profiles and thermal transient models of XLPE-insulated underground cables are analyzed for thermal aging evaluation of the cable. Since the underground cables have limitations in accessibility, observability, and application of diagnosis techniques, it is crucial to assess the cable condition and to determine appropriate replacement time. The thermal aging of power cables is mainly caused by heat loss on its conductor by the load current. Therefore, in this paper, real-world load profiles of an XLPE insulated underground cable are used to assess the thermal aging. With the load profiles, the thermal transient models are used to estimate the conductor temperature. The estimated temperatures are applied to the Arrhenius model for thermal aging evaluation. For three different load profiles, the results of the thermal aging assessment are compared and the results show the relation between average loads and thermal aging. The proposed technique will enable us to determine the proper replacement time of the underground cable in terms of the thermal aging.

Original languageEnglish
Title of host publicationCEIDP 2017 - IEEE Conference on Electrical Insulation and Dielectric Phenomenon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages205-208
Number of pages4
ISBN (Electronic)9781538611944
DOIs
Publication statusPublished - 2017 Jul 1
Event2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017 - Texas, United States
Duration: 2017 Oct 222017 Oct 25

Publication series

NameAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Volume2017-October
ISSN (Print)0084-9162

Other

Other2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon, CEIDP 2017
Country/TerritoryUnited States
CityTexas
Period17/10/2217/10/25

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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