Thermal activation effects on the stoichiometry of indium zinc oxide thin-film transistors

Na Kim Doo, Gun Hee Kim, Dong Lim Kim, Si Joon Kim, Heon Je Kim

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)1689
Number of pages1693
JournalPhysica Status Solidi (A) Applications and Materials Science
Issue number7
Publication statusPublished - 2010 Jul

Cite this