The influence of oxygen high pressure annealing on the performance and bias instability of amorphous Ge-In-Ga-O thin film transistors

Byung Du Ahn, Hyun Suk Kim, You Seung Rim, Jin Seong Park, Heon Je Kim

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)
Original languageEnglish
Pages (from-to)4132
Number of pages4136
JournalIEEE Transactions on Electron Devices
Issue number12
Publication statusPublished - 2014 Oct

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