The incorporation of SiO2 nanoparticles in poly(p- phenylenevinylene)(PPV) for PPV/SiO2 nanocomposite

Sook Yoon; Ki Hyun Yoon; Hyung Ho Park

doi:10.1007/s10832-007-9295-z

The incorporation of SiO₂ nanoparticles in poly(p- phenylenevinylene)(PPV) for PPV/SiO₂ nanocomposite

Sook Yoon, Ki Hyun Yoon, Hyung Ho Park

Department of Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The changes in surface morphology and current-voltage characteristics of poly(p-phenylenevinylene)(PPV) thin film has been studied by varying the amount of incorporated SiO₂ nanoparticles. The electronic structure of carbon atom in PPV and PPV/SiO₂ nanocomposite films was studied by using near-edge X-ray absorption fine structure. The surface morphology of PPV/SiO₂ nanocomposite film was found to be greatly dependent on the amount of incorporated SiO₂ nanoparticles. The current-voltage behavior of PPV/SiO₂ nanocomposite film was mainly dependent on the surface morphology of the film. The excess content of SiO₂ nanoparticles in PPV/SiO₂ nanocomposite film was revealed to induce an agglomeration of SiO₂ nanoparticles where blocking of electronic conduction happens.

Original language	English
Pages (from-to)	752-756
Number of pages	5
Journal	Journal of Electroceramics
Volume	21
Issue number	1-4 SPEC. ISS.
DOIs	https://doi.org/10.1007/s10832-007-9295-z
Publication status	Published - 2008 Dec

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Mechanics of Materials
Electrical and Electronic Engineering
Materials Chemistry

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abstract = "The changes in surface morphology and current-voltage characteristics of poly(p-phenylenevinylene)(PPV) thin film has been studied by varying the amount of incorporated SiO2 nanoparticles. The electronic structure of carbon atom in PPV and PPV/SiO2 nanocomposite films was studied by using near-edge X-ray absorption fine structure. The surface morphology of PPV/SiO2 nanocomposite film was found to be greatly dependent on the amount of incorporated SiO2 nanoparticles. The current-voltage behavior of PPV/SiO2 nanocomposite film was mainly dependent on the surface morphology of the film. The excess content of SiO2 nanoparticles in PPV/SiO2 nanocomposite film was revealed to induce an agglomeration of SiO2 nanoparticles where blocking of electronic conduction happens.",

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AU - Yoon, Ki Hyun

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PY - 2008/12

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AB - The changes in surface morphology and current-voltage characteristics of poly(p-phenylenevinylene)(PPV) thin film has been studied by varying the amount of incorporated SiO2 nanoparticles. The electronic structure of carbon atom in PPV and PPV/SiO2 nanocomposite films was studied by using near-edge X-ray absorption fine structure. The surface morphology of PPV/SiO2 nanocomposite film was found to be greatly dependent on the amount of incorporated SiO2 nanoparticles. The current-voltage behavior of PPV/SiO2 nanocomposite film was mainly dependent on the surface morphology of the film. The excess content of SiO2 nanoparticles in PPV/SiO2 nanocomposite film was revealed to induce an agglomeration of SiO2 nanoparticles where blocking of electronic conduction happens.

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The incorporation of SiO₂ nanoparticles in poly(p- phenylenevinylene)(PPV) for PPV/SiO₂ nanocomposite

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