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The effects of post-annealing on the performance of ZnO thin film transistors
Seokhwan Bang, Seungjun Lee, Joohyun Park, Soyeon Park, Youngbin Ko, Changhwan Choi, Hojung Chang, Hyungho Park, Hyeongtag Jeon
Research output: Contribution to journal › Article › peer-review
26
Citations
(Scopus)