@inproceedings{66087b38c534468798ce5d2e05665dc3,
title = "The effects of active layer thickness in solution-processed HfInZnO TFTs",
abstract = "In this paper, the effects of active layer thickness in HfInZnO (HIZO) thin film transistors (TFTs) have been investigated for device optimization using solution process. Total carrier density and bulk resistance (Rbulk) of HIZO TFTs were considered for solution-processed HIZO TFTs optimization.",
author = "Jeong, {Woong Hee} and Kim, {Gun Hee} and Kim, {Dong Lim} and Shin, {Hyun Soo} and Kim, {Hyun Jae} and Ryu, {Myung Kwan} and Park, {Kyung Bae} and Seon, {Jong Baek} and Lee, {Sang Yoon}",
year = "2010",
language = "English",
isbn = "9781617827020",
series = "Proceedings of International Meeting on Information Display",
pages = "506--507",
booktitle = "10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010",
note = "10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 ; Conference date: 11-10-2010 Through 15-10-2010",
}