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The effect of the photo-induced carriers on the reliability of oxide TFTs under various intensities of light
Soo Yeon Lee, Sun Jae Kim, Young Wook Lee, Woo Geun Lee, Kap Soo Yoon, Jang Yeon Kwon, Min Koo Han
Research output: Contribution to journal › Article › peer-review
17
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(Scopus)