The effect of ion-beam bombardment on solution-processed nickel oxide films used for liquid crystal alignment

Hae Chang Jeong; Jonghoon Won; Ju Hwan Lee; Dong Hyun Kim; Dong Wook Lee; Yun Gun Lee; Byeong Yun Oh; Jeong min Han; Dae Shik Seo

doi:10.1149/2.0081904jss

The effect of ion-beam bombardment on solution-processed nickel oxide films used for liquid crystal alignment

Hae Chang Jeong, Jonghoon Won, Ju Hwan Lee, Dong Hyun Kim, Dong Wook Lee, Yun Gun Lee, Byeong Yun Oh, Jeong min Han, Dae Shik Seo

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We induced a homogeneous liquid crystal (LC) alignment state on ion-beam (IB)-irradiated NiO films fabricated via solution-processing. A topographical analysis was performed using field emission-scanning electron microscopy of the films after various annealing temperatures. After IB irradiation, the surface of the NiO films was rough irrespective of annealing temperature. IB-irradiated NiO films exhibited slightly reduced transparency in the visible region compared to as-deposited NiO film. Moreover, the IB-irradiated NiO films fabricated at the lowest annealing temperature of 100°C exhibited uniform homogeneous LC alignment caused by microgroove-like topographic modification and chemical modification of the NiO surface by the IB irradiation. The pretilt angle of the LC molecules on IB-irradiated NiO film annealed at 100, 200, 300, and 400°C were on average 0.02 0.05, 0.43, and 0.05^o, respectively, making IB-irradiated NiO film eminently suitable for LC alignment.

Original language	English
Pages (from-to)	R66-R69
Journal	ECS Journal of Solid State Science and Technology
Volume	8
Issue number	4
DOIs	https://doi.org/10.1149/2.0081904jss
Publication status	Published - 2019

Bibliographical note

Funding Information:
This research was supported by the National Research Foundation of Korea (grant No. 2018-11-0902).

Publisher Copyright:
© 2019 The Electrochemical Society.

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials

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10.1149/2.0081904jss

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title = "The effect of ion-beam bombardment on solution-processed nickel oxide films used for liquid crystal alignment",

abstract = "We induced a homogeneous liquid crystal (LC) alignment state on ion-beam (IB)-irradiated NiO films fabricated via solution-processing. A topographical analysis was performed using field emission-scanning electron microscopy of the films after various annealing temperatures. After IB irradiation, the surface of the NiO films was rough irrespective of annealing temperature. IB-irradiated NiO films exhibited slightly reduced transparency in the visible region compared to as-deposited NiO film. Moreover, the IB-irradiated NiO films fabricated at the lowest annealing temperature of 100°C exhibited uniform homogeneous LC alignment caused by microgroove-like topographic modification and chemical modification of the NiO surface by the IB irradiation. The pretilt angle of the LC molecules on IB-irradiated NiO film annealed at 100, 200, 300, and 400°C were on average 0.02 0.05, 0.43, and 0.05o, respectively, making IB-irradiated NiO film eminently suitable for LC alignment.",

author = "Jeong, {Hae Chang} and Jonghoon Won and Lee, {Ju Hwan} and Kim, {Dong Hyun} and Lee, {Dong Wook} and Lee, {Yun Gun} and Oh, {Byeong Yun} and Han, {Jeong min} and Seo, {Dae Shik}",

note = "Funding Information: This research was supported by the National Research Foundation of Korea (grant No. 2018-11-0902). Publisher Copyright: {\textcopyright} 2019 The Electrochemical Society.",

year = "2019",

doi = "10.1149/2.0081904jss",

language = "English",

volume = "8",

pages = "R66--R69",

journal = "ECS Journal of Solid State Science and Technology",

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T1 - The effect of ion-beam bombardment on solution-processed nickel oxide films used for liquid crystal alignment

AU - Jeong, Hae Chang

AU - Won, Jonghoon

AU - Lee, Ju Hwan

AU - Kim, Dong Hyun

AU - Lee, Dong Wook

AU - Lee, Yun Gun

AU - Oh, Byeong Yun

AU - Han, Jeong min

AU - Seo, Dae Shik

PY - 2019

Y1 - 2019

N2 - We induced a homogeneous liquid crystal (LC) alignment state on ion-beam (IB)-irradiated NiO films fabricated via solution-processing. A topographical analysis was performed using field emission-scanning electron microscopy of the films after various annealing temperatures. After IB irradiation, the surface of the NiO films was rough irrespective of annealing temperature. IB-irradiated NiO films exhibited slightly reduced transparency in the visible region compared to as-deposited NiO film. Moreover, the IB-irradiated NiO films fabricated at the lowest annealing temperature of 100°C exhibited uniform homogeneous LC alignment caused by microgroove-like topographic modification and chemical modification of the NiO surface by the IB irradiation. The pretilt angle of the LC molecules on IB-irradiated NiO film annealed at 100, 200, 300, and 400°C were on average 0.02 0.05, 0.43, and 0.05o, respectively, making IB-irradiated NiO film eminently suitable for LC alignment.

AB - We induced a homogeneous liquid crystal (LC) alignment state on ion-beam (IB)-irradiated NiO films fabricated via solution-processing. A topographical analysis was performed using field emission-scanning electron microscopy of the films after various annealing temperatures. After IB irradiation, the surface of the NiO films was rough irrespective of annealing temperature. IB-irradiated NiO films exhibited slightly reduced transparency in the visible region compared to as-deposited NiO film. Moreover, the IB-irradiated NiO films fabricated at the lowest annealing temperature of 100°C exhibited uniform homogeneous LC alignment caused by microgroove-like topographic modification and chemical modification of the NiO surface by the IB irradiation. The pretilt angle of the LC molecules on IB-irradiated NiO film annealed at 100, 200, 300, and 400°C were on average 0.02 0.05, 0.43, and 0.05o, respectively, making IB-irradiated NiO film eminently suitable for LC alignment.

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JO - ECS Journal of Solid State Science and Technology

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ER -

The effect of ion-beam bombardment on solution-processed nickel oxide films used for liquid crystal alignment

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