The effect of copper hexadecafluorophthalocyanine (F16CuPc) inter-layer on pentacene thin-film transistors

J. H. Park; S. W. Cho; S. H. Park; J. G. Jeong; H. J. Kim; Y. Yi; M. H. Cho

doi:10.1016/j.synthmet.2009.10.013

The effect of copper hexadecafluorophthalocyanine (F₁₆CuPc) inter-layer on pentacene thin-film transistors

J. H. Park, S. W. Cho, S. H. Park, J. G. Jeong, H. J. Kim, Y. Yi, M. H. Cho

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

We report the impact of a copper hexadecafluorophthalocyanine (F₁₆CuPc) layer inserted between the electrode (Ag and Au) and the pentacene active layer in organic thin-film transistors (OTFTs). The electrical characteristics of the transistor are highly improved with the insertion of F₁₆CuPc in devices having either an Ag or an Au electrode. The threshold voltage was reduced remarkably from -26.20 V to -3.72 V after inserting the F₁₆CuPc layer in the device with an Ag electrode. In order to examine the effect of the F₁₆CuPc layer, we evaluated the energy level alignments at the interfaces of pentacene/Ag and pentacene/F₁₆CuPc/Ag by in situ ultraviolet photoelectron spectroscopy. The hole-injection barrier from the Ag electrode to the pentacene layer is 0.55 eV with F₁₆CuPc, while it is 0.80 eV without F₁₆CuPc. The enhancements in the threshold and turn-on voltages are understood with the energy level alignments at the electrode-pentacene interface.

Original language	English
Pages (from-to)	108-112
Number of pages	5
Journal	Synthetic Metals
Volume	160
Issue number	1-2
DOIs	https://doi.org/10.1016/j.synthmet.2009.10.013
Publication status	Published - 2010 Jan

Bibliographical note

Funding Information:
This work was partially supported by the BK 21 program and the IT R&D program of MKE/IITA (2008-F-023-01, next generation future device fabricated by using nano junction).

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/j.synthmet.2009.10.013

Cite this

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title = "The effect of copper hexadecafluorophthalocyanine (F16CuPc) inter-layer on pentacene thin-film transistors",

abstract = "We report the impact of a copper hexadecafluorophthalocyanine (F16CuPc) layer inserted between the electrode (Ag and Au) and the pentacene active layer in organic thin-film transistors (OTFTs). The electrical characteristics of the transistor are highly improved with the insertion of F16CuPc in devices having either an Ag or an Au electrode. The threshold voltage was reduced remarkably from -26.20 V to -3.72 V after inserting the F16CuPc layer in the device with an Ag electrode. In order to examine the effect of the F16CuPc layer, we evaluated the energy level alignments at the interfaces of pentacene/Ag and pentacene/F16CuPc/Ag by in situ ultraviolet photoelectron spectroscopy. The hole-injection barrier from the Ag electrode to the pentacene layer is 0.55 eV with F16CuPc, while it is 0.80 eV without F16CuPc. The enhancements in the threshold and turn-on voltages are understood with the energy level alignments at the electrode-pentacene interface.",

author = "Park, {J. H.} and Cho, {S. W.} and Park, {S. H.} and Jeong, {J. G.} and Kim, {H. J.} and Y. Yi and Cho, {M. H.}",

note = "Funding Information: This work was partially supported by the BK 21 program and the IT R&D program of MKE/IITA (2008-F-023-01, next generation future device fabricated by using nano junction).",

year = "2010",

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doi = "10.1016/j.synthmet.2009.10.013",

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AU - Park, J. H.

AU - Cho, S. W.

AU - Park, S. H.

AU - Jeong, J. G.

AU - Kim, H. J.

AU - Yi, Y.

AU - Cho, M. H.

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N2 - We report the impact of a copper hexadecafluorophthalocyanine (F16CuPc) layer inserted between the electrode (Ag and Au) and the pentacene active layer in organic thin-film transistors (OTFTs). The electrical characteristics of the transistor are highly improved with the insertion of F16CuPc in devices having either an Ag or an Au electrode. The threshold voltage was reduced remarkably from -26.20 V to -3.72 V after inserting the F16CuPc layer in the device with an Ag electrode. In order to examine the effect of the F16CuPc layer, we evaluated the energy level alignments at the interfaces of pentacene/Ag and pentacene/F16CuPc/Ag by in situ ultraviolet photoelectron spectroscopy. The hole-injection barrier from the Ag electrode to the pentacene layer is 0.55 eV with F16CuPc, while it is 0.80 eV without F16CuPc. The enhancements in the threshold and turn-on voltages are understood with the energy level alignments at the electrode-pentacene interface.

AB - We report the impact of a copper hexadecafluorophthalocyanine (F16CuPc) layer inserted between the electrode (Ag and Au) and the pentacene active layer in organic thin-film transistors (OTFTs). The electrical characteristics of the transistor are highly improved with the insertion of F16CuPc in devices having either an Ag or an Au electrode. The threshold voltage was reduced remarkably from -26.20 V to -3.72 V after inserting the F16CuPc layer in the device with an Ag electrode. In order to examine the effect of the F16CuPc layer, we evaluated the energy level alignments at the interfaces of pentacene/Ag and pentacene/F16CuPc/Ag by in situ ultraviolet photoelectron spectroscopy. The hole-injection barrier from the Ag electrode to the pentacene layer is 0.55 eV with F16CuPc, while it is 0.80 eV without F16CuPc. The enhancements in the threshold and turn-on voltages are understood with the energy level alignments at the electrode-pentacene interface.

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