@inproceedings{2f348ef9114445718c2ecf12e7b1133f,
title = "The effect of AC bias frequency on threshold voltage shift of the amorphous oxide TFTs",
abstract = "We investigated AC bias stress instability of indium-gallium-zinc-oxide (IGZO) Thin-film transistors (TFTs). AC bias frequency dependence showed different aspect in IGZO TFTs and a-Si:H TFTs. Influencing factors to AC bias frequency dependence of instability is charge accumulation characteristic under negative bias stress, and detrapping characteristics of shallow trapped charges under positive bias stress.",
author = "Kim, {Sun Jae} and Lee, {Young Wook} and Lee, {Soo Yeon} and Woo, {Jong Suk} and Kwon, {Jang Yeon} and Han, {Min Koo} and Lee, {Woo Geun} and Yoon, {Kap Soo}",
year = "2011",
language = "English",
isbn = "9781618390967",
series = "49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011",
pages = "1195--1197",
booktitle = "49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011",
note = "49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011 ; Conference date: 15-05-2011 Through 20-05-2011",
}