Test resource reused debug scheme to reduce the post-silicon debug cost

Inhyuk Choi, Hyunggoy Oh, Young Woo Lee, Sungho Kang

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)


In this paper, a design for debug (DFD) method that reuses test resources is proposed to reduce the debug cost in post-silicon validation. With the proposed method, the trace buffer is shared for embedded cores to capture the signatures of each core concurrently by reusing a test access mechanism. In this case, the depth of the trace buffer allocated to the core is reconfigurable and variable according to debug scheme. The experimental results indicate that the proposed DFD significantly reduces the debug time when the trace buffer is shared by cores in various debug cases.

Original languageEnglish
Article number8359333
Pages (from-to)1835-1839
Number of pages5
JournalIEEE Transactions on Computers
Issue number12
Publication statusPublished - 2018 Dec 1

Bibliographical note

Funding Information:
This research was supported by the MOTIE (Ministry of Trade, Industry & Energy) (10067813) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device.

Publisher Copyright:
© 1968-2012 IEEE.

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics


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