Test point insertion with control points driven by existing functional flip-flops

Joon Sung Yang, Nur A. Touba, Benoit Nadeau-Dostie

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)


This paper presents a novel test point insertion method for pseudorandom built-in self-test (BIST) to reduce the area overhead. The proposed method replaces dedicated flip-flops for driving control points by existing functional flip-flops. For each control point, candidate functional flip-flops are identified by using logic cone analysis that investigates the path inversion parity, logical distance, and reconvergence from each control point. Four types of new control point structures are introduced based on the logic cone analysis results to avoid degrading the testability. Experimental results indicate that the proposed method significantly reduces test point area overhead by replacing the dedicated flip-flops and achieves essentially the same fault coverage as conventional test point implementations using dedicated flip-flops driving the control points.

Original languageEnglish
Article number6035679
Pages (from-to)1473-1483
Number of pages11
JournalIEEE Transactions on Computers
Issue number10
Publication statusPublished - 2012

Bibliographical note

Funding Information:
This research was supported in part by the US National Science Foundation (NSF) under Grant No. CCF-0916837.

All Science Journal Classification (ASJC) codes

  • Software
  • Theoretical Computer Science
  • Hardware and Architecture
  • Computational Theory and Mathematics


Dive into the research topics of 'Test point insertion with control points driven by existing functional flip-flops'. Together they form a unique fingerprint.

Cite this