Test point insertion with control point by greater use of existing functional flip-flops

Joon Sung Yang, Nur A. Touba

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


This paper presents a novel test point insertion (TPI) method for a pseudo-random built-in self-test (BIST) to reduce the area overhead. Recently, a new TPI method for BISTs was proposed that tries to use functional flip-flops to drive control test points instead of adding extra dedicated flip-flops for driving control points. The replacement rule used in a previous work has limitations preventing some dedicated flip-flops from being replaced by functional flip-flops. This paper proposes a logic cone analysis-based TPI approach to overcome the limitations. Logic cone analysis is performed to find candidate functional flop-flops for replacing dedicated flip-flops. Experimental results indicate that the proposed method reduces the test point area overhead significantly with minimal loss of testability by replacing the dedicated flipflops.

Original languageEnglish
Pages (from-to)942-952
Number of pages11
JournalETRI Journal
Issue number6
Publication statusPublished - 2014 Dec 1

Bibliographical note

Publisher Copyright:
© 2014 ETRI.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Computer Science(all)
  • Electrical and Electronic Engineering


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