Test of DC reactor type fault current limiter using SMES magnet for optimal design

Eung Ro Lee, Seungje Lee, Chanjoo Lee, Ho Jun Suh, Duck Kweon Bae, Ho Min Kim, Yong Soo Yoon, Tae Kuk Ko

Research output: Contribution to journalConference articlepeer-review

16 Citations (Scopus)


This paper deals with the operational characteristics of a three-phase DC reactor type fault current limiter (FCL) at a short-circuit test. This type FCL consists of transformers, diodes, and a superconducting coil. In this paper, a superconducting coil, low-Tc SMES magnet, is made of Nb-Ti and the power system of the experimental circuit is 400 V/7 A class. This is a preliminary step to develop its faculties for applications to high voltage transmission line. As the results of the experiment, the values are referred to the limitation rate about 77% and 90% when the turns ratio of transformer was 1 and 2, respectively.

Original languageEnglish
Pages (from-to)850-853
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Issue number1
Publication statusPublished - 2002 Mar
Event17th Annual Conference on Magnet Technology - Geneva, Switzerland
Duration: 2001 Sept 242001 Sept 28

Bibliographical note

Funding Information:
Manuscript received September 24, 2001. This work was supported in part by MOST (Ministry of Science and Technology) and KEPRI (Korea Electric Power Research Institute) in South Korea. E. R. Lee, S. Lee, C. Lee, H.-J. Suh, D. K. Bae, H. M. Kim and T. K. Ko are with the Department of Electrical and Electronic Engineering, Yonsei University (e-mail: unglo@yonsei.ac.kr). Y.-S. Yoon is with the Department of Electrical Engineering, Ansan College of Technology (e-mail: ysyoon@ansantc.ac.kr). Publisher Item Identifier S 1051-8223(02)03688-6.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


Dive into the research topics of 'Test of DC reactor type fault current limiter using SMES magnet for optimal design'. Together they form a unique fingerprint.

Cite this