Test case generation of a protocol by a fault coverage analysis

Tae Hyong Kim; Ik Soon Hwang; Min Seok Jang; Sung Won Kang; Jai Yong Lee; Sang Bae Lee

doi:10.1109/ICOIN.1998.648603

Test case generation of a protocol by a fault coverage analysis

Tae Hyong Kim, Ik Soon Hwang, Min Seok Jang, Sung Won Kang, Jai Yong Lee, Sang Bae Lee

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying 'all-du-paths' criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method.

Original language	English
Title of host publication	Proceedings - 12th International Conference on Information Networking, ICOIN 1998
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	690-695
Number of pages	6
ISBN (Electronic)	0818672250, 9780818672255
DOIs	https://doi.org/10.1109/ICOIN.1998.648603
Publication status	Published - 1998
Event	12th International Conference on Information Networking, ICOIN 1998 - Koganei, Tokyo, Japan Duration: 1998 Jan 21 → 1998 Jan 23

Publication series

Name	Proceedings - 12th International Conference on Information Networking, ICOIN 1998

Conference

Conference	12th International Conference on Information Networking, ICOIN 1998
Country/Territory	Japan
City	Koganei, Tokyo
Period	98/1/21 → 98/1/23

Bibliographical note

Funding Information:
* This research was supported by the Korea Telecom R&D Group in Korea

Publisher Copyright:
© 1998 IEEE.

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Hardware and Architecture
Information Systems

Access to Document

10.1109/ICOIN.1998.648603

Cite this

Kim, T. H., Hwang, I. S., Jang, M. S., Kang, S. W., Lee, J. Y., & Lee, S. B. (1998). Test case generation of a protocol by a fault coverage analysis. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998 (pp. 690-695). (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICOIN.1998.648603

@inproceedings{8b6c97686d2a4f219d6e0ae1901b35fa,

title = "Test case generation of a protocol by a fault coverage analysis",

abstract = "In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying 'all-du-paths' criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method.",

author = "Kim, {Tae Hyong} and Hwang, {Ik Soon} and Jang, {Min Seok} and Kang, {Sung Won} and Lee, {Jai Yong} and Lee, {Sang Bae}",

note = "Funding Information: * This research was supported by the Korea Telecom R&D Group in Korea Publisher Copyright: {\textcopyright} 1998 IEEE.; 12th International Conference on Information Networking, ICOIN 1998 ; Conference date: 21-01-1998 Through 23-01-1998",

year = "1998",

doi = "10.1109/ICOIN.1998.648603",

language = "English",

series = "Proceedings - 12th International Conference on Information Networking, ICOIN 1998",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "690--695",

booktitle = "Proceedings - 12th International Conference on Information Networking, ICOIN 1998",

address = "United States",

}

Kim, TH, Hwang, IS, Jang, MS, Kang, SW, Lee, JY & Lee, SB 1998, Test case generation of a protocol by a fault coverage analysis. in Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Proceedings - 12th International Conference on Information Networking, ICOIN 1998, Institute of Electrical and Electronics Engineers Inc., pp. 690-695, 12th International Conference on Information Networking, ICOIN 1998, Koganei, Tokyo, Japan, 98/1/21. https://doi.org/10.1109/ICOIN.1998.648603

Test case generation of a protocol by a fault coverage analysis. / Kim, Tae Hyong; Hwang, Ik Soon; Jang, Min Seok et al.
Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc., 1998. p. 690-695 (Proceedings - 12th International Conference on Information Networking, ICOIN 1998).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Test case generation of a protocol by a fault coverage analysis

AU - Kim, Tae Hyong

AU - Hwang, Ik Soon

AU - Jang, Min Seok

AU - Kang, Sung Won

AU - Lee, Jai Yong

AU - Lee, Sang Bae

PY - 1998

Y1 - 1998

N2 - In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying 'all-du-paths' criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method.

AB - In this paper we generate conformance test cases for a communication protocol modeled in an EFSM(Extended Finite State Machine) by a fault coverage analysis. For the analysis model, we choose the expanded EFSM to resolve the inter-dependency problem between control and data flows within an EFSM. An expanded EFSM has several useful properties and makes it easy to generate test cases. For test case generation, at first we define data elements in the expanded EFSM. With the definition, we define some probable fault models in edges of the expanded EFSM and discuss what test cases to be needed for satisfying each fault model. The analysis shows that control flow test cases with full fault coverage and data flow test cases satisfying 'all-du-paths' criterion are needed to guarantee high fault coverage in the expanded EFSM. A mass of generated test cases by high fault coverage is optimized through some steps. The result of a simple protocol shows the efficacy of this method.

UR - http://www.scopus.com/inward/record.url?scp=84866787703&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866787703&partnerID=8YFLogxK

U2 - 10.1109/ICOIN.1998.648603

DO - 10.1109/ICOIN.1998.648603

M3 - Conference contribution

AN - SCOPUS:84866787703

T3 - Proceedings - 12th International Conference on Information Networking, ICOIN 1998

SP - 690

EP - 695

BT - Proceedings - 12th International Conference on Information Networking, ICOIN 1998

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 12th International Conference on Information Networking, ICOIN 1998

Y2 - 21 January 1998 through 23 January 1998

ER -

Kim TH, Hwang IS, Jang MS, Kang SW, Lee JY, Lee SB. Test case generation of a protocol by a fault coverage analysis. In Proceedings - 12th International Conference on Information Networking, ICOIN 1998. Institute of Electrical and Electronics Engineers Inc. 1998. p. 690-695. (Proceedings - 12th International Conference on Information Networking, ICOIN 1998). doi: 10.1109/ICOIN.1998.648603

Test case generation of a protocol by a fault coverage analysis

Abstract

Publication series

Conference

Bibliographical note

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this