Temperature and voltage droop-aware test scheduling during scan shift operation

Taehee Lee, Yongjoon Kim, Joon Sung Yang

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Hotspots and voltage droops have become critical problems during scan test. They are minimized by dynamically varying clock frequency during scan shift operation. We control average and peak temperature by adjusting the clock frequency assigned to each core. This proposed method is applied to multi-core System-on-Chip (SoC). Experimental results show that our method achieves 28% peak temperature reduction and 38% average temperature reduction.

Original languageEnglish
Article number20160581
Journalieice electronics express
Issue number18
Publication statusPublished - 2016

Bibliographical note

Publisher Copyright:
© IEICE 2016.

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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