Tail fitting yield estimation method for resistive non-volatile memory

Taehui Na; Seung H. Kang; Seong Ook Jung

doi:10.1109/ICEIC49074.2020.9051000

Tail fitting yield estimation method for resistive non-volatile memory

Taehui Na, Seung H. Kang, Seong Ook Jung

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

This paper demonstrates that the read output voltage difference between data and reference voltages in a resistive non-volatile memory is not a Gaussian distribution but composed of two Gaussian distributions. In addition, a tail fitting method is proposed to estimate a read yield with high accuracy. Monte Carlo HSPICE simulation results based on industry-compatible 45-nm model parameters show that the proposed tail fitting method improves accuracy by 5.2x and 2.5 x compared to the normal fitting and the importance sampling methods, respectively.

Original language	English
Title of host publication	2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728162898
DOIs	https://doi.org/10.1109/ICEIC49074.2020.9051000
Publication status	Published - 2020 Jan
Event	2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 - Barcelona, Spain Duration: 2020 Jan 19 → 2020 Jan 22

Publication series

Name	2020 International Conference on Electronics, Information, and Communication, ICEIC 2020

Conference

Conference	2020 International Conference on Electronics, Information, and Communication, ICEIC 2020
Country/Territory	Spain
City	Barcelona
Period	20/1/19 → 20/1/22

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

All Science Journal Classification (ASJC) codes

Computer Networks and Communications
Computer Science Applications
Hardware and Architecture
Information Systems and Management
Electrical and Electronic Engineering

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10.1109/ICEIC49074.2020.9051000

Cite this

Na, T., Kang, S. H., & Jung, S. O. (2020). Tail fitting yield estimation method for resistive non-volatile memory. In 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 Article 9051000 (2020 International Conference on Electronics, Information, and Communication, ICEIC 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICEIC49074.2020.9051000

@inproceedings{40ad80d9537548c39de2be8e6189cfea,

title = "Tail fitting yield estimation method for resistive non-volatile memory",

abstract = "This paper demonstrates that the read output voltage difference between data and reference voltages in a resistive non-volatile memory is not a Gaussian distribution but composed of two Gaussian distributions. In addition, a tail fitting method is proposed to estimate a read yield with high accuracy. Monte Carlo HSPICE simulation results based on industry-compatible 45-nm model parameters show that the proposed tail fitting method improves accuracy by 5.2x and 2.5 x compared to the normal fitting and the importance sampling methods, respectively.",

keywords = "Monte Carlo, Process variation, Read yield, Resistive non-volatile memory, Tail fitting, Yield estimation",

author = "Taehui Na and Kang, {Seung H.} and Jung, {Seong Ook}",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020 ; Conference date: 19-01-2020 Through 22-01-2020",

year = "2020",

month = jan,

doi = "10.1109/ICEIC49074.2020.9051000",

language = "English",

series = "2020 International Conference on Electronics, Information, and Communication, ICEIC 2020",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2020 International Conference on Electronics, Information, and Communication, ICEIC 2020",

address = "United States",

}

Na, T, Kang, SH & Jung, SO 2020, Tail fitting yield estimation method for resistive non-volatile memory. in 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020., 9051000, 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020, Institute of Electrical and Electronics Engineers Inc., 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020, Barcelona, Spain, 20/1/19. https://doi.org/10.1109/ICEIC49074.2020.9051000

Tail fitting yield estimation method for resistive non-volatile memory. / Na, Taehui; Kang, Seung H.; Jung, Seong Ook.
2020 International Conference on Electronics, Information, and Communication, ICEIC 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9051000 (2020 International Conference on Electronics, Information, and Communication, ICEIC 2020).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Tail fitting yield estimation method for resistive non-volatile memory

AU - Na, Taehui

AU - Kang, Seung H.

AU - Jung, Seong Ook

PY - 2020/1

Y1 - 2020/1

N2 - This paper demonstrates that the read output voltage difference between data and reference voltages in a resistive non-volatile memory is not a Gaussian distribution but composed of two Gaussian distributions. In addition, a tail fitting method is proposed to estimate a read yield with high accuracy. Monte Carlo HSPICE simulation results based on industry-compatible 45-nm model parameters show that the proposed tail fitting method improves accuracy by 5.2x and 2.5 x compared to the normal fitting and the importance sampling methods, respectively.

AB - This paper demonstrates that the read output voltage difference between data and reference voltages in a resistive non-volatile memory is not a Gaussian distribution but composed of two Gaussian distributions. In addition, a tail fitting method is proposed to estimate a read yield with high accuracy. Monte Carlo HSPICE simulation results based on industry-compatible 45-nm model parameters show that the proposed tail fitting method improves accuracy by 5.2x and 2.5 x compared to the normal fitting and the importance sampling methods, respectively.

KW - Monte Carlo

KW - Process variation

KW - Read yield

KW - Resistive non-volatile memory

KW - Tail fitting

KW - Yield estimation

UR - http://www.scopus.com/inward/record.url?scp=85083521061&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85083521061&partnerID=8YFLogxK

U2 - 10.1109/ICEIC49074.2020.9051000

DO - 10.1109/ICEIC49074.2020.9051000

M3 - Conference contribution

AN - SCOPUS:85083521061

T3 - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020

BT - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020

Y2 - 19 January 2020 through 22 January 2020

ER -

Na T, Kang SH, Jung SO. Tail fitting yield estimation method for resistive non-volatile memory. In 2020 International Conference on Electronics, Information, and Communication, ICEIC 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9051000. (2020 International Conference on Electronics, Information, and Communication, ICEIC 2020). doi: 10.1109/ICEIC49074.2020.9051000

Tail fitting yield estimation method for resistive non-volatile memory

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