TY - JOUR
T1 - Surface texturing of crystalline silicon solar cell using silicon nanowires
AU - Do, Kyeom Seon
AU - Kang, Min Gu
AU - Park, Je Jun
AU - Kang, Gi Hwan
AU - Myoung, Jae Min
AU - Song, Hee Eun
PY - 2013/9
Y1 - 2013/9
N2 - Surface texturing with silicon nanowires on a pyramidal structure was explored by simple metal-assisted chemical etching to improve the electrical performance of a silicon solar cell. The length of nanowires was controlled by changing the etching time in a H2O2/HF solution after Ag ion adsorption. The weighted reflectance from 300 to 1200nm was reduced to as low as 4.6% with a 200-nm-long nanowire formed by 30 s etching, while the pyramid surface had a 12.3% reflectance before antireflection (AR) coating deposition. However, the surface textured with 200-nm-long silicon nanowires had a similar reflectance, even after AR coating, and a decreased conversion efficiency in the completed solar cell. Since the silicon wafer with 200-nm-long nanowires had a deep and narrow structure, the AR layer could not be deposited uniformly, which resulted in a low passivation quality and an antireflection effect. This means that the surface structure, even with low reflectance, cannot be appropriate in the cell fabrication process because it is not capable of improving the solar cell performance characteristics. On the other hand, the 30-nm-long nanowire-textured silicon solar cell formed by 2 s etching had a decreased reflectance and improved electrical properties. As a result, the 30-nmlong silicon nanowire-textured solar cell exhibited improved performance characteristics, Jsc 1/4 0:3 mA/cm2, Voc 1/4 2 mV, and 1/4 0:2%, compared with only a pyramidal textured surface. This suggests that a respectable quality in the passivation and antireflection layers, as well as reflectance reduction, in nanoscale-textured silicon solar cells is required for silicon solar cell performance.
AB - Surface texturing with silicon nanowires on a pyramidal structure was explored by simple metal-assisted chemical etching to improve the electrical performance of a silicon solar cell. The length of nanowires was controlled by changing the etching time in a H2O2/HF solution after Ag ion adsorption. The weighted reflectance from 300 to 1200nm was reduced to as low as 4.6% with a 200-nm-long nanowire formed by 30 s etching, while the pyramid surface had a 12.3% reflectance before antireflection (AR) coating deposition. However, the surface textured with 200-nm-long silicon nanowires had a similar reflectance, even after AR coating, and a decreased conversion efficiency in the completed solar cell. Since the silicon wafer with 200-nm-long nanowires had a deep and narrow structure, the AR layer could not be deposited uniformly, which resulted in a low passivation quality and an antireflection effect. This means that the surface structure, even with low reflectance, cannot be appropriate in the cell fabrication process because it is not capable of improving the solar cell performance characteristics. On the other hand, the 30-nm-long nanowire-textured silicon solar cell formed by 2 s etching had a decreased reflectance and improved electrical properties. As a result, the 30-nmlong silicon nanowire-textured solar cell exhibited improved performance characteristics, Jsc 1/4 0:3 mA/cm2, Voc 1/4 2 mV, and 1/4 0:2%, compared with only a pyramidal textured surface. This suggests that a respectable quality in the passivation and antireflection layers, as well as reflectance reduction, in nanoscale-textured silicon solar cells is required for silicon solar cell performance.
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U2 - 10.7567/JJAP.52.092301
DO - 10.7567/JJAP.52.092301
M3 - Article
AN - SCOPUS:84883891424
SN - 0021-4922
VL - 52
JO - Japanese journal of applied physics
JF - Japanese journal of applied physics
IS - 9
M1 - 092301
ER -