Stress effect on cycle properties of the silicon thin-film anode

Seung Joo Lee, Jong Ki Lee, Sang Hun Chung, Heon Young Lee, Sung Man Lee, Hong Koo Baik

Research output: Contribution to journalConference articlepeer-review

146 Citations (Scopus)


Si thin-film electrodes were deposited by rf magnetron sputtering method, and stress variation during charge and discharge process was measured. When Si reacts with Li forming several alloy phases sequentially, large volume expansion occurs inducing compressive stress. On Li insertion to 0 V, the formation of Li4.4Si phase, which have a volume three or four times larger than Si, causes a microcracking in the electrode, thereby the cycle performance is deteriorated. However, by limiting the lower cut-off voltage to 0.1 V, the cyclability was improved significantly. This is attributed to the reduction of the crack formation due to volume expansion, as inferred from the stress variation profile.

Original languageEnglish
Pages (from-to)191-193
Number of pages3
JournalJournal of Power Sources
Publication statusPublished - 2001 Jul
Event10th International Meeting on Lithium Batteries - Como, Italy
Duration: 2001 May 282001 Jun 2

All Science Journal Classification (ASJC) codes

  • Renewable Energy, Sustainability and the Environment
  • Energy Engineering and Power Technology
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering


Dive into the research topics of 'Stress effect on cycle properties of the silicon thin-film anode'. Together they form a unique fingerprint.

Cite this