Stain defect detection for mobile phone camera modules

Sehee Hong; Chulhee Lee

doi:10.1117/12.2043223

Stain defect detection for mobile phone camera modules

Sehee Hong, Chulhee Lee

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.

Original language	English
Title of host publication	Proceedings of SPIE-IS and T Electronic Imaging - Image Processing
Subtitle of host publication	Machine Vision Applications VII
Publisher	SPIE
ISBN (Print)	9780819499417
DOIs	https://doi.org/10.1117/12.2043223
Publication status	Published - 2014
Event	Image Processing: Machine Vision Applications VII - San Francisco, CA, United States Duration: 2014 Feb 3 → 2014 Feb 4

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	9024
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Other

Other	Image Processing: Machine Vision Applications VII
Country/Territory	United States
City	San Francisco, CA
Period	14/2/3 → 14/2/4

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2043223

Cite this

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title = "Stain defect detection for mobile phone camera modules",

abstract = "In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.",

author = "Sehee Hong and Chulhee Lee",

year = "2014",

doi = "10.1117/12.2043223",

language = "English",

isbn = "9780819499417",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

booktitle = "Proceedings of SPIE-IS and T Electronic Imaging - Image Processing",

address = "United States",

note = "Image Processing: Machine Vision Applications VII ; Conference date: 03-02-2014 Through 04-02-2014",

}

Hong, S & Lee, C 2014, Stain defect detection for mobile phone camera modules. in Proceedings of SPIE-IS and T Electronic Imaging - Image Processing: Machine Vision Applications VII., 902403, Proceedings of SPIE - The International Society for Optical Engineering, vol. 9024, SPIE, Image Processing: Machine Vision Applications VII, San Francisco, CA, United States, 14/2/3. https://doi.org/10.1117/12.2043223

Stain defect detection for mobile phone camera modules. / Hong, Sehee; Lee, Chulhee.
Proceedings of SPIE-IS and T Electronic Imaging - Image Processing: Machine Vision Applications VII. SPIE, 2014. 902403 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 9024).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Stain defect detection for mobile phone camera modules

AU - Hong, Sehee

AU - Lee, Chulhee

PY - 2014

Y1 - 2014

N2 - In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.

AB - In this paper, we present a stain defect detection algorithm based on the difference of window mean brightness. In particular, we use the maximum square value of the difference brightness in divided windows (MAXWDMS). Window shapes generally affect WDMS values and make stain images clearly distinguishable. The proposed method consists of three steps: window design, stain localization using MAXWDMS and setting the WDMS level. The proposed methodology has been successfully used in stain defect detection, achieving good detection rates in both quantitative evaluation and sensibility estimation. Experimental results show improved detection accuracy and a satisfactory processing time.

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DO - 10.1117/12.2043223

M3 - Conference contribution

AN - SCOPUS:84897416687

SN - 9780819499417

T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Proceedings of SPIE-IS and T Electronic Imaging - Image Processing

PB - SPIE

T2 - Image Processing: Machine Vision Applications VII

Y2 - 3 February 2014 through 4 February 2014

ER -

Stain defect detection for mobile phone camera modules

Abstract

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