Stability of Solution-processed ZrInZnO Thin-Film Transistors under Gate Bias Stress

Tae Hoon Jeong, Si Joon Kim, Doo Hyun Yoon, Woong Hee Jeong, Dong Lim Kim, Hyun Soo Lim, Heon Je Kim

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
JournalJournal of the Korean Physical Society
Issue number2
Publication statusPublished - 2011 Aug

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