TY - JOUR
T1 - Solution for warpage in the liquid crystal display module process
AU - Kim, Jong Hwan
AU - Hwang, Jeoung Yeon
AU - Kim, Byoung Yong
AU - Kim, Jong Yeon
AU - Kang, Dong Hun
AU - Seo, Dae Shik
PY - 2006/12
Y1 - 2006/12
N2 - We propose a module technology that solves the problem of warpage, which cause bending of the substrate in liquid crystal displays (LCDs). The characteristics and behavior of cell-gap and glass warpage under thermal energy were observed, and the effects of glass warpage were investigated. It was found that applied heat in the compression process in the case of the chip-on-glass (CPG) technique decreased the uniformity of the cell-gap. We showed that deterioration of the cell-gap caused glass warpage under the high temperature of the compression process. Thus, a preheating substrate treatment was carried out before compression as a solution to glass warpage. A contact surface illuminometer was employed to measure the bending of the substrate. As a result, the glass warpage was decreased and a uniform cell-gap was obtained.
AB - We propose a module technology that solves the problem of warpage, which cause bending of the substrate in liquid crystal displays (LCDs). The characteristics and behavior of cell-gap and glass warpage under thermal energy were observed, and the effects of glass warpage were investigated. It was found that applied heat in the compression process in the case of the chip-on-glass (CPG) technique decreased the uniformity of the cell-gap. We showed that deterioration of the cell-gap caused glass warpage under the high temperature of the compression process. Thus, a preheating substrate treatment was carried out before compression as a solution to glass warpage. A contact surface illuminometer was employed to measure the bending of the substrate. As a result, the glass warpage was decreased and a uniform cell-gap was obtained.
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U2 - 10.1143/JJAP.45.L1277
DO - 10.1143/JJAP.45.L1277
M3 - Article
AN - SCOPUS:34547902149
SN - 0021-4922
VL - 45
SP - L1277-L1279
JO - Japanese Journal of Applied Physics
JF - Japanese Journal of Applied Physics
IS - 46-50
ER -