Soft x-ray spectroscopic study of the ferromagnetic insulator V 0.82 Cr0.18 O2

L. F.J. Piper, A. Demasi, S. W. Cho, A. R.H. Preston, J. Laverock, K. E. Smith, K. G. West, J. W. Lu, S. A. Wolf

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28 Citations (Scopus)


The chromium-vanadium oxide system V1-x Crx O 2 (0.1<x<0.2) displays both insulating character in the rutile phase and room-temperature ferromagnetism. A combination of x-ray photoemission spectroscopy, resonant inelastic x-ray scattering, and resonant x-ray emission spectroscopy of the V L3,2, OK, and Cr L3,2 edges was used to study the electronic structure near the Fermi level of V0.82 Cr0.12 O2. Our results show that the chromium enters as Cr3⊃+ with the d3 configuration, resulting in the formation of Cr3⊃+ -V5⊃+ ion pairs, in contrast to the simple Cr4⊃+ substitution expected from the end members VO2 and CrO2. The occupied Cr3d orbital is located ∼2 eV below the Fermi level. Comparison with the parent material VO2 reveals significant changes in the O2p bandwidth and increased O2p-V3d hybridization in V0.82 Cr0.12 O 2, which are attributed to the reduced atomic spacing upon doping. Two energy loss features due to d- d⊃ - transitions are observed at 0.95 and 1.75 eV in the V L3 -edge x-ray scattering spectra and are explained in terms of the splitting of the t2g -derived π band.

Original languageEnglish
Article number235103
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number23
Publication statusPublished - 2010 Dec 1

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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