Abstract
A new X-ray image sensor is demonstrated with an oxide thin-film transistor backplane and HgI2 sensing material. It displays outstanding image quality under a low X-ray exposure and a low electric field. It is promising as a state-of-the-art device to realize highly resolved images at a low X-ray dose for a variety of medical X-ray imaging applications.
Original language | English |
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Pages (from-to) | 51-57 |
Number of pages | 7 |
Journal | Advanced Healthcare Materials |
Volume | 4 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2015 Jan 1 |
Bibliographical note
Publisher Copyright:© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
All Science Journal Classification (ASJC) codes
- Biomaterials
- Biomedical Engineering
- Pharmaceutical Science