Signal integrity enhancement of high-speed digital interconnect with discontinuous and asymmetric structures for mobile applications

Tae Wan Koo, Hee Do Kang, Jeunguk Ha, Eunkwang Koh, Jong Gwan Yook

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

In this paper, signal integrity (SI) of a mobile high-definition link (MHL) system is analyzed, having the discontinuous and asymmetric structures. In the SI analysis of the MHL system, three dimensional (3D) electromagnetic (EM) solver and time domain reflectometry (TDR) method are carried out. As a result, the differential signals with the discontinuous reference plane experience the degeneration of transmission characteristic due to the impedance mismatch, rendering by discontinuities in return current path of the signals. Moreover, it is found that the SI characteristic of the differential signal could be significantly degenerated, when the asymmetric guard traces with ground vias for electromagnetic interference (EMI) reduction are located closer to the signal trace than the balanced reference plane. Therefore, SI can be guaranteed with widely open eye diagram using the symmetric and continuous reference plane for the coupled signal lines in the high-speed digital interconnect.

Original languageEnglish
Title of host publicationProceedings - 2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Pages713-717
Number of pages5
DOIs
Publication statusPublished - 2013
Event2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013 - Denver, CO, United States
Duration: 2013 Aug 52013 Aug 9

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Other

Other2013 IEEE International Symposium on Electromagnetic Compatibility, EMC 2013
Country/TerritoryUnited States
CityDenver, CO
Period13/8/513/8/9

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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