TY - JOUR
T1 - Side-illuminated tip-enhanced Raman study of edge phonon in graphene at the electrical breakdown limit
AU - Okuno, Yoshito
AU - Vantasin, Sanpon
AU - Yang, In Sang
AU - Son, Jangyup
AU - Hong, Jongill
AU - Tanaka, Yoshito Yannick
AU - Nakata, Yasushi
AU - Ozaki, Yukihiro
AU - Naka, Nobuyuki
N1 - Publisher Copyright:
© 2016 Author(s).
PY - 2016/4/18
Y1 - 2016/4/18
N2 - Nanoscale integration of graphene into a circuit requires a stable performance under high current density. However, the effects of the current density that approach the electronic breakdown limit of graphene are not well understood. We explored the effects of a high current density, close to the electronic breakdown limit of 10 A/cm (∼3.0 × 108Acm2), on graphene, using tip-enhanced Raman scattering. The results showed that the high current density induces Raman bands at 1456 and 1530 cm-1, which were assigned to edge-phonon modes originating from zigzag and armchair edges. This led us to conclude that C-C bonds are cleaved due to the high current density, leaving edge structures behind, which were detected through the observation of localized phonons.
AB - Nanoscale integration of graphene into a circuit requires a stable performance under high current density. However, the effects of the current density that approach the electronic breakdown limit of graphene are not well understood. We explored the effects of a high current density, close to the electronic breakdown limit of 10 A/cm (∼3.0 × 108Acm2), on graphene, using tip-enhanced Raman scattering. The results showed that the high current density induces Raman bands at 1456 and 1530 cm-1, which were assigned to edge-phonon modes originating from zigzag and armchair edges. This led us to conclude that C-C bonds are cleaved due to the high current density, leaving edge structures behind, which were detected through the observation of localized phonons.
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U2 - 10.1063/1.4947559
DO - 10.1063/1.4947559
M3 - Article
AN - SCOPUS:84967332903
SN - 0003-6951
VL - 108
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 16
M1 - 163110
ER -