Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films

Kyujung Kim; Eun Jin Cho; Yong Min Huh; Donghyun Kim

doi:10.1364/biomed.2008.bmd65

Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films

Kyujung Kim, Eun Jin Cho, Yong Min Huh, Donghyun Kim

Research output: Contribution to conference › Paper › peer-review

Abstract

The evanescent field enhancement was investigated experimentally based on dielectric thin films in total internal reflection microscopy. The sample employed Al2O3 and SiO2 layers deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent microbeads relative to that of a control sample without dielectric films was polarization dependent and was in good agreement with numerical results. The thin-film-based sensitivity enhancement was also qualitatively confirmed in live-cell imaging of quantum dots.

Original language	English
Pages	BMD65
DOIs	https://doi.org/10.1364/biomed.2008.bmd65
Publication status	Published - 2008
Event	Biomedical Optics, BIOMED 2008 - St. Petersburg, FL, United States Duration: 2008 Mar 16 → 2008 Mar 19

Other

Other	Biomedical Optics, BIOMED 2008
Country/Territory	United States
City	St. Petersburg, FL
Period	08/3/16 → 08/3/19

All Science Journal Classification (ASJC) codes

Biomedical Engineering
Biomaterials
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

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10.1364/biomed.2008.bmd65

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title = "Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films",

abstract = "The evanescent field enhancement was investigated experimentally based on dielectric thin films in total internal reflection microscopy. The sample employed Al2O3 and SiO2 layers deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent microbeads relative to that of a control sample without dielectric films was polarization dependent and was in good agreement with numerical results. The thin-film-based sensitivity enhancement was also qualitatively confirmed in live-cell imaging of quantum dots.",

author = "Kyujung Kim and Cho, {Eun Jin} and Huh, {Yong Min} and Donghyun Kim",

year = "2008",

doi = "10.1364/biomed.2008.bmd65",

language = "English",

pages = "BMD65",

note = "Biomedical Optics, BIOMED 2008 ; Conference date: 16-03-2008 Through 19-03-2008",

}

TY - CONF

T1 - Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films

AU - Kim, Kyujung

AU - Cho, Eun Jin

AU - Huh, Yong Min

AU - Kim, Donghyun

PY - 2008

Y1 - 2008

N2 - The evanescent field enhancement was investigated experimentally based on dielectric thin films in total internal reflection microscopy. The sample employed Al2O3 and SiO2 layers deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent microbeads relative to that of a control sample without dielectric films was polarization dependent and was in good agreement with numerical results. The thin-film-based sensitivity enhancement was also qualitatively confirmed in live-cell imaging of quantum dots.

AB - The evanescent field enhancement was investigated experimentally based on dielectric thin films in total internal reflection microscopy. The sample employed Al2O3 and SiO2 layers deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent microbeads relative to that of a control sample without dielectric films was polarization dependent and was in good agreement with numerical results. The thin-film-based sensitivity enhancement was also qualitatively confirmed in live-cell imaging of quantum dots.

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UR - http://www.scopus.com/inward/citedby.url?scp=84884321600&partnerID=8YFLogxK

U2 - 10.1364/biomed.2008.bmd65

DO - 10.1364/biomed.2008.bmd65

M3 - Paper

AN - SCOPUS:84884321600

SP - BMD65

T2 - Biomedical Optics, BIOMED 2008

Y2 - 16 March 2008 through 19 March 2008

ER -

Sensitivity enhancement for total internal reflection fluorescence imaging using dielectric thin films

Abstract

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All Science Journal Classification (ASJC) codes

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