Semi-transparent UV-detecting ZnO-TFTs with polymer gate dielectric

Kimoon Lee, H. S. Bae, Jeong M. Choi, D. K. Hwang, Jae Hoon Kim, Seongil Im

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We report on the fabrication of ZnO-based ultraviolet (UV)-detecting thin-film transistors (TFTs) with a semitransparent conducting NiOx top-gate electrode window and 450 nm-thick poly-4-vinylphenol (PVP) gate dielectric layer that has been formed on n-ZnO by spin-casting. The field effect electron mobility of our device was only about 0.0032 cm2/Vs at the saturation regime of gate bias showing a low saturation current level in the dark because the PVP dielectric has a relatively low dielectric capacitance (7.4 nF/cm2). The on/off current ratio of the device was about 103. However, the current increased up by more than 30 times with UV illumination of 325 nm wavelength (power density ∼50 μW/cm2) while the initial current level was not varied with visible green illumination. We conclude that our ZnO-TFT with organic gate dielectric can be a promising transparent UV-detecting device. copyright The Electrochemical Society.

Original languageEnglish
Title of host publicationStudent Posters (General)
PublisherElectrochemical Society Inc.
Number of pages11
ISBN (Electronic)9781566774765
Publication statusPublished - 2006
EventStudent Posters (General) - 208th Electrochemical Society Meeting - Los Angeles, CA, United States
Duration: 2005 Oct 162005 Oct 21

Publication series

NameECS Transactions
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737


OtherStudent Posters (General) - 208th Electrochemical Society Meeting
Country/TerritoryUnited States
CityLos Angeles, CA

All Science Journal Classification (ASJC) codes

  • Engineering(all)


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