Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

Yongjoon Kim; Jaeseok Park; Sungho Kang

doi:10.1587/elex.6.1432

Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

Yongjoon Kim, Jaeseok Park, Sungho Kang

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

Original language	English
Pages (from-to)	1432-1437
Number of pages	6
Journal	ieice electronics express
Volume	6
Issue number	20
DOIs	https://doi.org/10.1587/elex.6.1432
Publication status	Published - 2009 Oct 25

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1587/elex.6.1432

Cite this

@article{3991def7b6a24ff68f1826d26ecf2f36,

title = "Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume",

abstract = "In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.",

author = "Yongjoon Kim and Jaeseok Park and Sungho Kang",

year = "2009",

month = oct,

day = "25",

doi = "10.1587/elex.6.1432",

language = "English",

volume = "6",

pages = "1432--1437",

journal = "ieice electronics express",

issn = "1349-2543",

publisher = "The Institute of Electronics, Information and Communication Engineers (IEICE)",

number = "20",

}

TY - JOUR

T1 - Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

AU - Kim, Yongjoon

AU - Park, Jaeseok

AU - Kang, Sungho

PY - 2009/10/25

Y1 - 2009/10/25

N2 - In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

AB - In this paper, we present a selective scan slice encoding technique for power-aware test data compression. The proposed scheme dramatically reduces test data volume via scan slice repetition, and generates an adjacent-filled test pattern known as the favorable lowpower pattern mapping method. Experiments were performed on the large ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.

UR - http://www.scopus.com/inward/record.url?scp=70350530510&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70350530510&partnerID=8YFLogxK

U2 - 10.1587/elex.6.1432

DO - 10.1587/elex.6.1432

M3 - Article

AN - SCOPUS:70350530510

SN - 1349-2543

VL - 6

SP - 1432

EP - 1437

JO - ieice electronics express

JF - ieice electronics express

IS - 20

ER -

Selective scan slice repetition for simultaneous reduction of test power consumption and test data volume

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this