Selective scan slice grouping technique for efficient test data compression

Yongjoon Kim, Jaeseok Park, Sungho Kang

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)


This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.

Original languageEnglish
Pages (from-to)380-383
Number of pages4
JournalIEICE Transactions on Information and Systems
Issue number2
Publication statusPublished - 2010

All Science Journal Classification (ASJC) codes

  • Software
  • Hardware and Architecture
  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering
  • Artificial Intelligence


Dive into the research topics of 'Selective scan slice grouping technique for efficient test data compression'. Together they form a unique fingerprint.

Cite this