Abstract
Conventional stereo matching methods provide the unsatisfactory results for stereo pairs under uncontrolled environments such as illumination distortions and camera device changes. A majority of efforts to address this problem has devoted to develop robust cost function. However, the stereo matching results by cost function cannot be liberated from a false correspondence when radiometric distortions exist. This paper presents a robust stereo matching approach based on probabilistic Laplacian propagation. In the proposed method, reliable ground control points are selected using weighted mutual information and reliability check. The ground control points are then propagated with probabilistic Laplacian. Since only reliable matching is propagated with the reliability of GCP, the proposed approach is robust to a false initial matching. Experimental results demonstrate the effectiveness of the proposed method in stereo matching for image pairs taken under illumination and exposure distortions.
Original language | English |
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Title of host publication | Proceedings of SPIE-IS and T Electronic Imaging - Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2015 |
Editors | Robert Sitnik, William Puech |
Publisher | SPIE |
ISBN (Electronic) | 9781628414837 |
DOIs | |
Publication status | Published - 2015 |
Event | Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2015 - San Francisco, United States Duration: 2015 Feb 10 → 2015 Feb 12 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 9393 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Other
Other | Three-Dimensional Image Processing, Measurement (3DIPM), and Applications 2015 |
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Country/Territory | United States |
City | San Francisco |
Period | 15/2/10 → 15/2/12 |
Bibliographical note
Publisher Copyright:© 2015 SPIE-IS&T.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering