Abstract
The deposition power dependence of visible transmittance and refractive index of room temperature-deposited ZnO:Al thin films by RF magnetron sputtering has been studied. All films exhibited high visible transmittance and near-complete UV absorption. The refractive index of the films decreased continuously with an increase in the RF power at all photon energies in the visible and near-IR region, which has been partially attributed to the decreased packing density of the films. For each film, the refractive index exhibited strong frequency dispersion in the weak-absorption region. The origin of optical dispersion at different RF power has been discussed in the light of a single-oscillator model.
Original language | English |
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Pages (from-to) | 347-351 |
Number of pages | 5 |
Journal | Applied Physics A: Materials Science and Processing |
Volume | 115 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2014 Apr |
Bibliographical note
Funding Information:This work was financially supported by the Converging Research Center Program (2012K001270) and by the National Research Foundation of Korea (NRF) grant funded by the Korean government (MEST) (2011-0020285).
All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Materials Science(all)