TY - GEN
T1 - Review on optical and electrical properties of oxide semiconductors
AU - Kim, Dong Lim
AU - Kim, Hyun Jae
PY - 2010
Y1 - 2010
N2 - Oxide semiconductors became one of the potential elements for large area electronics such as a channel for thin film transistors. Optical and electrical properties were modified by alloying or doping of several oxide materials; In2O3, ZnO, Ga2O3, and SnO 2. The excellent properties achieved at the ternary or quaternary alloys could be explained by the role of each materials as a carrier controller, a conduction path, and etc. The metal oxide semiconductors were generally deposited by vacuum process but recently, alternative ways, like a sol-gel or an ink-jet printing, are suggested. In this review, diverse approaches on oxide semiconductors are shown, and an in-depth discussion of the optical and electrical properties alternation in metal oxide alloy fabricated by various methods is given.
AB - Oxide semiconductors became one of the potential elements for large area electronics such as a channel for thin film transistors. Optical and electrical properties were modified by alloying or doping of several oxide materials; In2O3, ZnO, Ga2O3, and SnO 2. The excellent properties achieved at the ternary or quaternary alloys could be explained by the role of each materials as a carrier controller, a conduction path, and etc. The metal oxide semiconductors were generally deposited by vacuum process but recently, alternative ways, like a sol-gel or an ink-jet printing, are suggested. In this review, diverse approaches on oxide semiconductors are shown, and an in-depth discussion of the optical and electrical properties alternation in metal oxide alloy fabricated by various methods is given.
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U2 - 10.1117/12.846661
DO - 10.1117/12.846661
M3 - Conference contribution
AN - SCOPUS:77951709258
SN - 9780819479990
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - Oxide-based Materials and Devices
T2 - Oxide-based Materials and Devices
Y2 - 24 January 2010 through 27 January 2010
ER -