Abstract
For three-dimensional (3D) topological insulators that have a layered structure, strain was used to control critical physical properties. Here, we show that tensile strain decreases bulk carrier density while accentuating transport of topological surface state using temperature-dependent resistance and magneto-resistance measurements, terahertz-time domain spectroscopy and density functional theory calculations. The induced strain was confirmed by transmittance X-ray scattering measurements. The results show the possibility of reversible topological surface state device control using structural deformation.
Original language | English |
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Pages (from-to) | 3820-3826 |
Number of pages | 7 |
Journal | Nano letters |
Volume | 15 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2015 Jun 10 |
Bibliographical note
Publisher Copyright:© 2015 American Chemical Society.
All Science Journal Classification (ASJC) codes
- Bioengineering
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
- Mechanical Engineering