Abstract
We have demonstrated resonant frequency-tuning of electrostatic torsional microscanners actuated by the staggered vertical comb (SVC) sets. Mechanical restriction unit composed of thermal actuator, scissor mechanism and shaft-holder is used for continuous and reversible resonant frequency tuning. The microscanner and tuning mechanism are fabricated on single crystal silicon of double Silicon-On-Insulator (DSOI) wafer in order to make vertically self-aligned comb sets and electrically insulate the electrostatic microscanner from the thermally actuated tuning unit to prevent charge leakage. The microscanner is actuated at a resonant frequency of 1.698 kHz under driving voltages of 5Vac and 1OVd, without frequency tuning. As the stiffness of a torsional spring is modified gradually through the shaft-holding flexure operated by thermal actuator, the resonant frequency of the torsional microscanner is shifted up to 1.880 kHz showing the maximum tuning ratio of 10.7%.
Original language | English |
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Article number | 4805344 |
Pages (from-to) | 164-167 |
Number of pages | 4 |
Journal | Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS) |
DOIs | |
Publication status | Published - 2009 |
Event | 22nd IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2009 - Sorrento, Italy Duration: 2009 Jan 25 → 2009 Jan 29 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanical Engineering
- Electrical and Electronic Engineering