Resistivity characteristics of plastic multi-barrier ITO film by the bending process

J. B. Park; J. Y. Hwang; D. S. Seo; S. K. Park; D. G. Moon; J. I. Han

doi:10.1080/00150190490453126

Resistivity characteristics of plastic multi-barrier ITO film by the bending process

J. B. Park, J. Y. Hwang, D. S. Seo, S. K. Park, D. G. Moon, J. I. Han

Department of Electrical and Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90% transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.

Original language	English
Pages (from-to)	155-158
Number of pages	4
Journal	Ferroelectrics
Volume	303
DOIs	https://doi.org/10.1080/00150190490453126
Publication status	Published - 2004 Jan 1

Bibliographical note

Funding Information:
This work was supported by National Research Laboratory program (M1-0203-00-0008).

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150190490453126

Cite this

@article{f1479b3afcfa404d9d5d97d1b47dea19,

title = "Resistivity characteristics of plastic multi-barrier ITO film by the bending process",

abstract = "We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90% transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.",

author = "Park, {J. B.} and Hwang, {J. Y.} and Seo, {D. S.} and Park, {S. K.} and Moon, {D. G.} and Han, {J. I.}",

note = "Funding Information: This work was supported by National Research Laboratory program (M1-0203-00-0008).",

year = "2004",

month = jan,

day = "1",

doi = "10.1080/00150190490453126",

language = "English",

volume = "303",

pages = "155--158",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - Resistivity characteristics of plastic multi-barrier ITO film by the bending process

AU - Park, J. B.

AU - Hwang, J. Y.

AU - Seo, D. S.

AU - Park, S. K.

AU - Moon, D. G.

AU - Han, J. I.

N1 - Funding Information: This work was supported by National Research Laboratory program (M1-0203-00-0008).

PY - 2004/1/1

Y1 - 2004/1/1

N2 - We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90% transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.

AB - We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90% transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.

UR - http://www.scopus.com/inward/record.url?scp=33746296562&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33746296562&partnerID=8YFLogxK

U2 - 10.1080/00150190490453126

DO - 10.1080/00150190490453126

M3 - Article

AN - SCOPUS:33746296562

SN - 0015-0193

VL - 303

SP - 155

EP - 158

JO - Ferroelectrics

JF - Ferroelectrics

ER -

Resistivity characteristics of plastic multi-barrier ITO film by the bending process

Abstract

Bibliographical note

All Science Journal Classification (ASJC) codes

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