Resistivity characteristics of plastic multi-barrier ITO film by the bending process

J. B. Park, J. Y. Hwang, D. S. Seo, S. K. Park, D. G. Moon, J. I. Han

Research output: Contribution to journalArticlepeer-review


We studied transmittance and electrical resistivity characteristics regarding bending of four other multi-barrier Indium tin oxide (ITO) film. Transmission showed there was about large 90% transmission above 550 nm wavelength at three multi-barrier structures. But, both-side hard coated structure showed relatively low 75% transmission above 550 nm wavelength. Also, resistivity change of four other multi-barrier film showed there was the lowest change at one-side hardcoat structure and the resistivity change of the center was larger than that of the edge.

Original languageEnglish
Pages (from-to)155-158
Number of pages4
Publication statusPublished - 2004 Jan 1

Bibliographical note

Funding Information:
This work was supported by National Research Laboratory program (M1-0203-00-0008).

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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