TY - GEN
T1 - Reliable Latency Extraction with NVSim Revision in Emerging NVM (ITC-CSCC 2019)
AU - Seo, Wonsuk
AU - Song, Byungkyu
AU - Jung, Seong Ook
PY - 2019/6
Y1 - 2019/6
N2 - In this paper, the reliability and practicality of NVSim, which provides the performances of nonvolatile memory to the system level, are improved. Since the conventional NVSim does not reflect the actually used technology or sense amplifier information, the latency among the extracted parameters from NVsim shows the biggest difference from that available in the industry. In order to solve this problem, NVsim is revised such that more reliable and practical data is reflected to NVSim according to the memory configuration. Thus, performances extracted from the proposed NVsim can be applied accurately according to the memory configuration. The simulation results using the proposed NVSim is compared with the actual results of the currently published NVM and it is confirmed that the proposed NVSim improves the accuracy by ∼ 57% compared with the conventional NVM.
AB - In this paper, the reliability and practicality of NVSim, which provides the performances of nonvolatile memory to the system level, are improved. Since the conventional NVSim does not reflect the actually used technology or sense amplifier information, the latency among the extracted parameters from NVsim shows the biggest difference from that available in the industry. In order to solve this problem, NVsim is revised such that more reliable and practical data is reflected to NVSim according to the memory configuration. Thus, performances extracted from the proposed NVsim can be applied accurately according to the memory configuration. The simulation results using the proposed NVSim is compared with the actual results of the currently published NVM and it is confirmed that the proposed NVSim improves the accuracy by ∼ 57% compared with the conventional NVM.
UR - http://www.scopus.com/inward/record.url?scp=85071447162&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85071447162&partnerID=8YFLogxK
U2 - 10.1109/ITC-CSCC.2019.8793402
DO - 10.1109/ITC-CSCC.2019.8793402
M3 - Conference contribution
T3 - 34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019
BT - 34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 34th International Technical Conference on Circuits/Systems, Computers and Communications, ITC-CSCC 2019
Y2 - 23 June 2019 through 26 June 2019
ER -