As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.
|Title of host publication||IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|Number of pages||2|
|ISBN (Electronic)||0780384237, 9780780384231|
|Publication status||Published - 2004|
|Event||2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan|
Duration: 2004 Jul 26 → 2004 Jul 28
|Name||IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai|
|Other||2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004|
|Period||04/7/26 → 04/7/28|
Bibliographical notePublisher Copyright:
© 2015 IEEE.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering