Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

Han Sung Joo; Su Chang Jeon; Bongyong Lee; Yong Hwan Kwon; Joong Seon Choe; Ilgu Yun

doi:10.1109/IMFEDK.2004.1566414

Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

Han Sung Joo, Su Chang Jeon, Bongyong Lee, Yong Hwan Kwon, Joong Seon Choe, Ilgu Yun

Department of Electrical and Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.

Original language	English
Title of host publication	IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai
Editors	Hiroshi Nozawa
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	73-74
Number of pages	2
ISBN (Electronic)	0780384237, 9780780384231
DOIs	https://doi.org/10.1109/IMFEDK.2004.1566414
Publication status	Published - 2004
Event	2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 - Kyoto, Japan Duration: 2004 Jul 26 → 2004 Jul 28

Publication series

Name	IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai

Other

Other	2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004
Country/Territory	Japan
City	Kyoto
Period	04/7/26 → 04/7/28

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/IMFEDK.2004.1566414

Cite this

Joo, H. S., Jeon, S. C., Lee, B., Kwon, Y. H., Choe, J. S., & Yun, I. (2004). Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. In H. Nozawa (Ed.), IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai (pp. 73-74). [1566414] (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMFEDK.2004.1566414

Joo, Han Sung ; Jeon, Su Chang ; Lee, Bongyong et al. / Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. editor / Hiroshi Nozawa. Institute of Electrical and Electronics Engineers Inc., 2004. pp. 73-74 (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai).

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title = "Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications",

abstract = "As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.",

author = "Joo, {Han Sung} and Jeon, {Su Chang} and Bongyong Lee and Kwon, {Yong Hwan} and Choe, {Joong Seon} and Ilgu Yun",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004 ; Conference date: 26-07-2004 Through 28-07-2004",

year = "2004",

doi = "10.1109/IMFEDK.2004.1566414",

language = "English",

series = "IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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editor = "Hiroshi Nozawa",

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}

Joo, HS, Jeon, SC, Lee, B, Kwon, YH, Choe, JS & Yun, I 2004, Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. in H Nozawa (ed.), IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai., 1566414, IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai, Institute of Electrical and Electronics Engineers Inc., pp. 73-74, 2nd International Meeting for Future of Electron Devices, Kansai, IMFEDK 2004, Kyoto, Japan, 04/7/26. https://doi.org/10.1109/IMFEDK.2004.1566414

Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. / Joo, Han Sung; Jeon, Su Chang; Lee, Bongyong et al.
IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. ed. / Hiroshi Nozawa. Institute of Electrical and Electronics Engineers Inc., 2004. p. 73-74 1566414 (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - As a summary, the reliability testing of mesa InGaAs WGPDs from the viewpoint of evaluation long-term reliability has been investigated using the accelerated life tests. From the reliability testing results, it was found that the WGPD structure yielded devices that exhibited the median lifetime of much longer than 106 h at practical use conditions. Consequently, this WGPD structure has sufficient characteristics for practical 40-Gb/s optical receiver modules.

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Joo HS, Jeon SC, Lee B, Kwon YH, Choe JS, Yun I. Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications. In Nozawa H, editor, IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai. Institute of Electrical and Electronics Engineers Inc. 2004. p. 73-74. 1566414. (IMFEDK 2004 - International Meeting for Future of Electron Devices, Kansai). doi: 10.1109/IMFEDK.2004.1566414

Reliability testing of InGaAs mesa stucture waveguide photodiodes for 40-Gb/s optical receiver applications

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